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BS PD IEC/TS 62607-6-4:2016
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Nanomanufacturing. Key control characteristics. Graphene. Surface conductance measurement using resonant cavity
standard by BSI Group, 10/31/2016
BS PD IEC/TS 62607-6-4:2016 establishes a method for determining the surface conductance of twodimensional(2D) single-layer or multi-layer atomically thin nano-carbon graphene structures.These are synthesized by chemical vapour deposition (CVD), epitaxial growth on siliconcarbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated fromgraphite [3]. The measurements are made in an air filled standard R100 rectangularwaveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].
Surface conductance measurement by resonant cavity involves monitoring the resonantfrequency shift and change in the quality factor before and after insertion of the specimen intothe cavity in a quantitative correlation with the specimen surface area. This measurementdoes not explicitly depend on the thickness of the nano-carbon layer. The thickness of thespecimen does not need to be known, but it is assumed that the lateral dimension is uniformover the specimen area.
Cross References:
IEC 60153-2
All current amendments available at time of purchase are included with the purchase of this document.
Product Details
- Published:
- 10/31/2016
- ISBN(s):
- 9780580910197
- Number of Pages:
- 22
- File Size:
- 1 file , 2.1 MB
- Product Code(s):
- 30327264, 30327264, 30327264
